A measurement system has been developed capable of mea-suring reflected optical power as low as 0.0025% with a spot size diam-eter of 24 Am. One application for this system is the characterization of small-area photodetectors. The operation of the measurement system is simple, allowing the operator to quickly make multiple reflection measurements, and it does not require a darkroom. The measurement system merges a microscope, for visual alignment and focusing of the laser beam, with a lightwave component analyzer using modulation vec-tor error correction. A measurement comparison between the analyzer-based system and a power-meter-based system showed that each sys-tem can measure reflections as low as 0.0025%. However, the analyzer-based system offers the advantage of identifying the location and magnitude of system reflections. The system operates at a wavelength of 1310 nm.