1 February 1990 Refractometry by minimum deviation: accuracy analysis
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Abstract
We analyze the accuracy achieved when evaluating high refractive indices by minimum deviation deflectometry.
Diana Tentori-Santa-Cruz, Jesus R. Lerma, "Refractometry by minimum deviation: accuracy analysis," Optical Engineering 29(2), (1 February 1990). https://doi.org/10.1117/12.55573 . Submission:
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