1 February 1990 Refractometry by minimum deviation: accuracy analysis
Author Affiliations +
Abstract
We analyze the accuracy achieved when evaluating high refractive indices by minimum deviation deflectometry.
Diana Tentori-Santa-Cruz, Diana Tentori-Santa-Cruz, Jesus R. Lerma, Jesus R. Lerma, } "Refractometry by minimum deviation: accuracy analysis," Optical Engineering 29(2), (1 February 1990). https://doi.org/10.1117/12.55573 . Submission:
JOURNAL ARTICLE
9 PAGES


SHARE
RELATED CONTENT

New Approach To Precision Automatic Refractometry
Proceedings of SPIE (September 24 1979)
Critical-angle refractometry: accuracy analysis
Proceedings of SPIE (November 30 1991)
Optical glass refractometry using holographic interferometry
Proceedings of SPIE (September 30 1990)
A super-corrected atmospheric dispersion corrector
Proceedings of SPIE (July 22 2008)

Back to Top