1 June 1990 Scanning tunneling microscopy studies of thin foil x-ray mirrors
Author Affiliations +
Abstract
In this paper scanning tunneling microscopy (STM) measurements of x-ray mirrors are presented. The x-ray mirrors are 0.3 mm thick dip-lacquered aluminum foils coated with gold by evaporation, as well as state-of-the-art polished surfaces coated with gold, platinum, or iridium. The measurements reveal that the surfaces consist of islands with different topographic features. The microroughness is found to be in the range from 7 to 15 Å, and the characteristic length scale for this microroughness is estimated to be between 0.03 and 0.06 |xm. For the thin foil mirrors it is found that the microroughness depends on the thickness of the gold layer. The roughness is smallest (~ 7 to 9 Å) for gold layers between ~ 100 and ~ 250 Å, and it becomes significantly greater (~10 to 15 Å) for gold layers thicker than ~ 350 Å. With a few exceptions the STM measurements agree well with recent x-ray studies. The results can be used as a guide when selecting the best coating process in the production of x-ray mirrors.
Finn Erland Christensen, Finn Erland Christensen, Flemming Besenbacher, Flemming Besenbacher, Jorgen Garnaes, Jorgen Garnaes, Erik Laegsgaard, Erik Laegsgaard, I. Stensgaard, I. Stensgaard, } "Scanning tunneling microscopy studies of thin foil x-ray mirrors," Optical Engineering 29(6), (1 June 1990). https://doi.org/10.1117/12.55645 . Submission:
JOURNAL ARTICLE
6 PAGES


SHARE
RELATED CONTENT

Direct fabrication of full-shell x-ray optics
Proceedings of SPIE (September 03 2015)
Wolter I x ray optics produced by diamond turning and...
Proceedings of SPIE (November 10 1994)
X-Ray Mirror Technology In The Axaf Era
Proceedings of SPIE (October 22 1984)
Design and fabrication of low-cost x-ray mirrors
Proceedings of SPIE (September 05 1995)
Fabrication of Wolter type I mirror for soft x-ray
Proceedings of SPIE (October 19 1992)

Back to Top