1 July 1990 Evaluation of a PtSi infrared camera
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Optical Engineering, 29(7), (1990). doi:10.1117/12.55653
Abstract
A 160x244 element PtSi IRCCD imaging array is characterized using a conventional approach commonly reported for visible imagers, introducing, as needed, issues specific to the IR. Mean-variance data are used to extract two CCD charge transfer efficiencies; one efficiency corresponds to the charge partitioning in a transfer (0.9987), and the other efficiency corresponds to the charge lost to charge pumping in a transfer (0.9994). The array is shown to be background limited for pixels near the output node. A 2-point correction is shown to substantially reduce fixed pattern noise of linear PtSi photodetectors at backgrounds offset from the points of correction, but it can introduce additional noise at the point of compensation if adequate precision is not used when calculating the 2nd-point coefficients. The measured D* (detectivity) and NE?T (noise equivalent temperature difference) are 6.5x1010 cm. ?Hz W-1 and 0.1°C, respectively. The horizontal and vertical MRT (minimum resolvable temperature) of the array is measured to be 0.02°C at a spatial frequency of 1//6 cycle/mrad. Pixel 1/f noise was below shot noise to 2x 10_5 Hz.
James E. Murguia, Jonathan Martin Mooney, William S. Ewing, "Evaluation of a PtSi infrared camera," Optical Engineering 29(7), (1 July 1990). https://doi.org/10.1117/12.55653
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