Low-conductivity, laser-irradiated thin films such as the chalcogenides
employed for optical data storage can display manifestations
of significant through-thickness thermal gradients. A combined Laplacetra
nsform, Fou rier-i nteg ral method was used to derive the tern peratu re
distributions in such films, and the results were used to examine the effects
of some marking parameters on through-thickness thermal gradients. The
results were in good qualitative agreement with experimental observations.