1 November 1991 Thermal scene projectors using microemitters
Author Affiliations +
Optical Engineering, 30(11), (1991). doi:10.1117/12.55991
Abstract
A number of techniques are under development for creating dynamic IR scenes for testing IR imaging systems. Comparison of these techniques may be misleading if appropriate performance parameters are not used. One straightforward method is the thermal emission from microemitters fabricated in an array. The small mass leads to good response times if crosstalk between elements and to any substrate can be limited. Silicon micromachining can create good performance in arrays of this type because of the excellent thermal isolation of the elements
Donald R. Stauffer, Barry E. Cole, "Thermal scene projectors using microemitters," Optical Engineering 30(11), (1 November 1991). https://doi.org/10.1117/12.55991
JOURNAL ARTICLE
4 PAGES


SHARE
RELATED CONTENT

Performance Of A Thermal Scene Generator
Proceedings of SPIE (June 30 1989)
"Progress In Schottky-Barrier IR Imagers"
Proceedings of SPIE (September 20 1987)
Recent Advances In Silicide Detectors
Proceedings of SPIE (October 03 1988)
State of the art in Schottky-barrier IR image sensors
Proceedings of SPIE (September 01 1992)
Recent Advances In Silicide Detectors
Proceedings of SPIE (October 03 1988)

Back to Top