1 September 1991 High-resolution electron microscope image analysis approach for superconductor YBa2Cu307-x
Author Affiliations +
Optical Engineering, 30(9), (1991). doi:10.1117/12.55942
Abstract
An HREM (High-resolution electron microscope) image analysis approach has been developed. The image filtering, segmentation and partides extraction based on gray-scale mathematical morphological operations, are performed on the original HREM image. The final image is a pseudocolor image, with the background removed, relatively uniform brightness, filtered slanting elongation, regular shape for every kind of particle, and particle boundaries that no longer touch each other so that the superconducting material structure can be shown clearly.
Jianhua Xu, Feng Lu, Chun-lin Jia, Zhongyi Hua, "High-resolution electron microscope image analysis approach for superconductor YBa2Cu307-x," Optical Engineering 30(9), (1 September 1991). http://dx.doi.org/10.1117/12.55942
JOURNAL ARTICLE
4 PAGES


SHARE
KEYWORDS
Particles

Superconductors

Electron microscopes

Image analysis

Binary data

Image filtering

Image segmentation

RELATED CONTENT

SPOT5: first in-flight radiometric image quality results
Proceedings of SPIE (April 08 2003)
Low-loss coatings for the VIRGO large mirrors
Proceedings of SPIE (February 25 2004)
A New 1.5 K Cryogenerator For Radioastronomical Use
Proceedings of SPIE (April 21 1986)
Fuzzy feature-based image mining in remote sensing
Proceedings of SPIE (March 27 2001)
Blockiness in JPEG-coded images
Proceedings of SPIE (May 19 1999)

Back to Top