1 September 1991 High-resolution electron microscope image analysis approach for superconductor YBa2Cu307-x
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Abstract
An HREM (High-resolution electron microscope) image analysis approach has been developed. The image filtering, segmentation and partides extraction based on gray-scale mathematical morphological operations, are performed on the original HREM image. The final image is a pseudocolor image, with the background removed, relatively uniform brightness, filtered slanting elongation, regular shape for every kind of particle, and particle boundaries that no longer touch each other so that the superconducting material structure can be shown clearly.
Jianhua Xu, Jianhua Xu, Feng Lu, Feng Lu, Chun-lin Jia, Chun-lin Jia, Zhongyi Hua, Zhongyi Hua, } "High-resolution electron microscope image analysis approach for superconductor YBa2Cu307-x," Optical Engineering 30(9), (1 September 1991). https://doi.org/10.1117/12.55942 . Submission:
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