Light scattering Mueller matrix for a surface contaminated by a single particle in the Rayleigh limit

Gorden W. Videen; William L. Wolfe; William S. Bickel

doi:10.1117/12.56076

1 February 1992 Light scattering Mueller matrix for a surface contaminated by a single particle in the Rayleigh limit

Gorden W. Videen, William L. Wolfe, William S. Bickel

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Optical Engineering, Vol. 31, Issue 2, (February 1992). https://doi.org/10.1117/12.56076

Abstract

A ray-tracing model was used to derive the light scattering Mueller matrix element curves for a dipole near a perfect surface as a function of incident angle, scattering angle, and surface refractive index. This system represents a fundamental system composed of a perfect plane surface and a perfect (Rayleigh) scatterer.

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Gorden W. Videen, William L. Wolfe, and William S. Bickel "Light scattering Mueller matrix for a surface contaminated by a single particle in the Rayleigh limit," Optical Engineering 31(2), (1 February 1992). https://doi.org/10.1117/12.56076

Published: 1 February 1992

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