The potential of electro-optic techniques for application to the testing of high-speed digital electronics is explored. The generic problem of digital testing is discussed along with the requirements for a 2-GHz testing scenario. A testing procedure appropriate for high-speed digital testing is described and the motivation for investigating optical techniques is discussed. A generalized optical architecture for generating, setting, and providing the high-speed digital input data to the device under test (DUT) is presented along with two candidate optical techniques for generating high-speed pulses. This is followed by a description of an optical architecture that is appropriate for receiving and comparing the DUT output signals. Low-cost programmable, picosecond-type delay lines and programmable time-division fiber optic multiplexers necessary for controlling the rate and timing of the input/output data are also presented.