1 March 1992 Signal transducing in optoelectronic measurement systems based on the moire phenomenon
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Optical Engineering, 31(3), (1992). doi:10.1117/12.56102
Abstract
We present an analysis and accuracy determination of the phenomena of mechanical, optical, and electronic signal transducing that takes place in optoelectronic measuring systems. As an object of theoretical and experimental investigation, length-measuring transducers have been adopted in which incremental masters are applied in the shape of binary amplitude diffraction gratings. In detector systems of those transducers, the moiré phenomenon is utilized. This phenomenon causes averaging of the errors of masters as well as makes possible the creation of optoelectronic structures that compensate for other error components, e.g., clearances in the transducer system. The results of analysis of the moiré pattern kinematics, which take into account parameters connected with the process of detection and structural transducer parameters, make possible the optimization of the transducer design.
Leszek Wronkowski, "Signal transducing in optoelectronic measurement systems based on the moire phenomenon," Optical Engineering 31(3), (1 March 1992). http://dx.doi.org/10.1117/12.56102
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KEYWORDS
Transducers

Moire patterns

Diffraction gratings

Optoelectronics

Photodetectors

Sensors

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