1 March 1993 High-accuracy critical angle refractometry
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Abstract
The measurement requirements of fifth-place refractometers based on the critical angle condition are analyzed. It is shown that the reference prism geometry limits the working interval of these instruments and that polarized light can be used to improve sensitivity.
Diana Tentori-Santa-Cruz, Diana Tentori-Santa-Cruz, Carlos Lopez Famozo, Carlos Lopez Famozo, } "High-accuracy critical angle refractometry," Optical Engineering 32(3), (1 March 1993). https://doi.org/10.1117/12.61047 . Submission:
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