1 May 1993 Testing aspheric surfaces using multiple annular interferograms
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Abstract
We present a technique for interferometrically testing aspheric surfaces without the use of compensating elements. The method consists of recording successive overlapping phase maps from a set of annular interferograms of an aspheric surface, obtained using a conventional phase-shifting interferometer and a micropositioning translator stage. These maps are then sewn together with a suitable algorithm we developed, and the whole surface error is recovered. Experimental results are shown to be in good agreement with the null lens test performed for comparison.
Mauro Melozzi, Luis Pezzati, Alessandro Mazzoni, "Testing aspheric surfaces using multiple annular interferograms," Optical Engineering 32(5), (1 May 1993). https://doi.org/10.1117/12.133344
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