1 May 1994 Guided-wave characterization techniques for the comparison of properties of different optical coatings
Author Affiliations +
Optical Engineering, 33(5), (1994). doi:10.1117/12.168427
Abstract
The specific behavior of optical thin films very often leads to limitations of optical system performance. Accurate characterization techniques for evaluating film properties are necessary to understand this behavior. Characterization techniques based on the propagation of guided waves in the thickness of the films appear to be very useful. We report our particular way to determine the refractive index and the thickness of both isotropic and anisotropic thin films. Guided-waves techniques are sensitive enough to detect slight variations of thin film optical constants, so we use them to study the variations of refractive index versus temperature. From this we can obtain the thermorefractive coefficients ∂n/∂T of our layers. Moreover, we can obtain, in some cases, the nonlinear refractive index coefficient. We also measure guided-wave attenuation and laser damage threshold with a digital imaging system. These means, dependent on guided waves, are used in combination for a comparative analysis of TiO2 and Ta2O5 layers made by different eposition techniques (conventional evaporation, ion assisted deposition and ion plating).
Francois Flory, Gerard Albrand, D. Endelema, N. Maythaveekulchai, Emile P. Pelletier, Herve Rigneault, "Guided-wave characterization techniques for the comparison of properties of different optical coatings," Optical Engineering 33(5), (1 May 1994). http://dx.doi.org/10.1117/12.168427
JOURNAL ARTICLE
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KEYWORDS
Refractive index

Wave propagation

Prisms

Thin films

Waveguides

Anisotropy

Polarization

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