1 August 1994 Reflection at the Motohiro-Taga interface of two anisotropic materials with columnar microstructures
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Optical Engineering, 33(8), (1994). doi:10.1117/12.177108
Abstract
While a thin film with columnar microstructures is growing, a Motohiro-Taga interface is formed when the angle of inclination of the microstructures is abruptly altered in the vertical plane. Reflection of a normally incident plane wave by a Motohiro-Taga interface has been studied. If the plane wave is TE-polarized with respect to the plane contaming the directions of inclination of the columnar microstructures, it is not reflected by the interface; but a TM-polarized plane wave is partially reflected. Because of its polarization-discrimination property, the Motohiro-Taga interface will find application as the basis for devices in the upper millimeter wave and the lower infrared frequency ranges.
Akhlesh Lakhtakia, Russell F. Messier, "Reflection at the Motohiro-Taga interface of two anisotropic materials with columnar microstructures," Optical Engineering 33(8), (1 August 1994). http://dx.doi.org/10.1117/12.177108
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KEYWORDS
Interfaces

Thin films

Reflection

Reflectivity

Beryllium

Dielectrics

Silicon films

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