1 October 1995 Development of a tunable, grating external cavity, strong feedback semiconductor laser with real-time wavelength monitoring
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Optical Engineering, 34(10), (1995). doi:10.1117/12.210752
Abstract
A novel tunable, grating external cavity, strong feedback semiconductor laser with real-time wavelength monitoring was designed, constructed, and tested. The wavelength monitoring was realized by recording the position of the second-order diffraction beam of the grating on a photodiode array. A wavelength tuning range of 16 nm from 648 to 664 nm, with a tuning resolution of better than 0.01 nm, was obtained. The verified tuning accuracy of the system was 0.1 nm, limited by the 0.1 nm accuracy of the monochromator used to calibrate the laser system.
Haiyin Sun, Steve Menhart, Alois J. Adams, "Development of a tunable, grating external cavity, strong feedback semiconductor laser with real-time wavelength monitoring," Optical Engineering 34(10), (1 October 1995). http://dx.doi.org/10.1117/12.210752
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KEYWORDS
Diffraction gratings

Stereolithography

Wavelength tuning

Diffraction

Mirrors

Semiconductor lasers

Photodiodes

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