1 December 1995 M-line spectroscopy for nonlinear characterization of polymeric waveguides
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Optical Engineering, 34(12), (1995). doi:10.1117/12.213240
Abstract
Nonlinear M-line spectroscopy is based on the analysis of the nonlinear change in the shape of the dark line associated with the excitation of guided waves. This is an easy technique for the determination of Kerr properties of thin films, which can constitute optical waveguides. Full spatiotemporal nonlinear modeling tools have been developed recently for nonlinear waveguide couplers, which are used for the determination of the complex nonlinear coefficient of organic polymers.
Guy Vitrant, Raymond Reinisch, Francois Kajzar, "M-line spectroscopy for nonlinear characterization of polymeric waveguides," Optical Engineering 34(12), (1 December 1995). https://doi.org/10.1117/12.213240
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