1 May 1995 Partially coherent transmittance of dielectric lamellae
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Optical Engineering, 34(5), (1995). doi:10.1117/12.199887
Abstract
We derive an analytic formula for the transmittance of a dielectric amelia when the interference between successive internal reflections is only partially spatially coherent. This allows effects such as surface roughness and nonparallelism, which produce cumulative distortions in the phase front with each reflection, and which result in a loss of fringe contrast at high frequencies, to be accounted for quantitatively. The transmittance of a Si lamella, measured with a Fourier-transform interferometer over the range 20 to 1000 cm-1 agrees with our formula to within the accuracy of the data, which is dominated by systematic instrumental effects.
Erich N. Grossman, Donald G. McDonald, "Partially coherent transmittance of dielectric lamellae," Optical Engineering 34(5), (1 May 1995). https://doi.org/10.1117/12.199887
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