1 June 1995 Mueller matrix imaging polarimetry
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Optical Engineering, 34(6), (1995). doi:10.1117/12.206161
Abstract
The design and operation of a Mueller matrix imaging polarimeter is presented. The instrument is configurable to make a wide variety of polarimetric measurements of optical systems and samples. In one configuration, it measures the polarization properties of a set of ray paths through a sample. The sample may comprise a single element, such as a lens, polarizer, retarder, spatial light modulator, or beamsplitter, or an entire optical system containing many elements. In a second configuration, it measures an optical system's point spread matrix, a Mueller matrix relating the polarization state of a point object to the distribution of intensity and polarization across the image. The instrument is described and a number of example measurements are provided that demonstrate the Mueller matrix imaging polarimeter's unique measurement capability.
J. Larry Pezzaniti, Russell A. Chipman, "Mueller matrix imaging polarimetry," Optical Engineering 34(6), (1 June 1995). http://dx.doi.org/10.1117/12.206161
JOURNAL ARTICLE
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KEYWORDS
Polarization

Polarimetry

Wave plates

Charge-coupled devices

Point spread functions

Polarizers

Imaging systems

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