1 August 1995 Picosecond diagnostics
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Abstract
This brief survey of picosecond diagnostics in the accelerator domain examines new electro-optics methods. In the past decade, the main progress in picosecond techniques has been in laser technology and electro-optics. Laser technology cannot be used directly for accelerator diagnostics, but the new, emerging techniques in optoelectronics are useful for single-shot measurement and picosecond diagnostics. Such techniques are needed for single-shot, multidimensional measurements of very short incoherent light pulses, and several devices have been developed at the European Organization for Nuclear Research (CERN) making use of the very wide spectrum of synchrotron light emitted by the particle beam. A very intense x-ray detector has been developed using picosecond photoconductivity. A new method using the photon storage ring and stochastic sampling of single photons enables single-shot measurement of some tens of picoseconds of light pulses, emitted at a wavelength of 1.3 μm. Visible, UV pulse light in a real-time 3-D measurement is analyzed using a new streak-camera method, giving longitudinal resolution of about 0.6 mm (2 ps) and 15 μm in transverse dimensions. All three instruments are certain to find applications in other fields.
Edouard Rossa, "Picosecond diagnostics," Optical Engineering 34(8), (1 August 1995). https://doi.org/10.1117/12.201817
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