1 August 1995 Two directional spatial-carrier phase-shifting method for analysis of crossed and closed fringe patterns
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Optical Engineering, 34(8), (1995). doi:10.1117/12.207112
Abstract
Various interferometric and fringe projection techniques may result in crossed and closed fringe patterns with the information about the phenomena tested. Recent applications require the analysis on the basis of a single fringe pattern. Here, we address two problems: simultaneous analysis of the information about two events, and analysis of fringe pattern with high phase gradients in both x and y directions. The analysis of a fringe pattern is performed by the spatial-carrier phase-shifting method used sequentially for x and y sampling directions. The error analysis of the method in reference to both problems is presented.
Maria Pirga, Malgorzata Kujawinska, "Two directional spatial-carrier phase-shifting method for analysis of crossed and closed fringe patterns," Optical Engineering 34(8), (1 August 1995). http://dx.doi.org/10.1117/12.207112
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KEYWORDS
Fringe analysis

Phase shifts

Error analysis

Interferometry

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