Spatial light modulator phase depth determination from optical diffraction information

John L. McClain Jr.; Peter S. Erbach; Don A. Gregory; Francis T. S. Yu

doi:10.1117/1.600704

1 April 1996 Spatial light modulator phase depth determination from optical diffraction information

John L. McClain Jr., Peter S. Erbach, Don A. Gregory, Francis T. S. Yu

Optical Engineering, Vol. 35, Issue 4, (April 1996). https://doi.org/10.1117/1.600704

A noninterferometric technique is presented for determining the phase modulating characteristics of spatial light modulators. Examining the far-field diffraction pattern intensity distribution for specific input functions enables the phase modulation to be calculated. Results are compared with usual interferometric techniques for a liquid crystal based modulator.

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John L. McClain Jr., Peter S. Erbach, Don A. Gregory, and Francis T. S. Yu "Spatial light modulator phase depth determination from optical diffraction information," Optical Engineering 35(4), (1 April 1996). https://doi.org/10.1117/1.600704

Published: 1 April 1996

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