1 January 1996 Transient phenomena analysis using dynamic speckle patterns
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Optical Engineering, 35(1), (1996). doi:10.1117/1.600789
Abstract
The full width at half maximum is sometimes used to characterize the autocorrelation function of the time history of a speckle pattern. We propose to include more autocorrelation points to diminish the variability of the measurement. The width of the equivalent rectangle (WER) and the X* LOG X measurements are defined and some simulations and experimental results obtained are shown.
Hector Jorge Rabal, Ricardo A. Arizaga, Nelly Lucia Cap, Marcelo Trivi, Graciela Romero, Elvio Alanis, "Transient phenomena analysis using dynamic speckle patterns," Optical Engineering 35(1), (1 January 1996). http://dx.doi.org/10.1117/1.600789
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KEYWORDS
Speckle pattern

Speckle

Lanthanum

Computer simulations

Biomedical optics

Error analysis

Visualization

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