1 January 1996 Transient phenomena analysis using dynamic speckle patterns
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The full width at half maximum is sometimes used to characterize the autocorrelation function of the time history of a speckle pattern. We propose to include more autocorrelation points to diminish the variability of the measurement. The width of the equivalent rectangle (WER) and the X* LOG X measurements are defined and some simulations and experimental results obtained are shown.
Hector Jorge Rabal, Hector Jorge Rabal, Ricardo A. Arizaga, Ricardo A. Arizaga, Nelly Lucia Cap, Nelly Lucia Cap, Marcelo Trivi, Marcelo Trivi, Graciela Romero, Graciela Romero, Elvio Alanis, Elvio Alanis, } "Transient phenomena analysis using dynamic speckle patterns," Optical Engineering 35(1), (1 January 1996). https://doi.org/10.1117/1.600789 . Submission:

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