1 November 1996 Aberrations introduced in off-axis testing of spherical surfaces
Author Affiliations +
Abstract
It is well known that off-axis testing of a spherical surface introduces aberrations, mainly primary astigmatism. The magnitudes of these aberrations are discussed and analytically calculated. Their influence in several testing configurations is discussed. A case of particular interest is when a linear carrier fringe pattern is used in a Fizeau interferometer.
Daniel Malacara-Hernandez, Daniel Malacara-Hernandez, Manuel Servin Guirado, Manuel Servin Guirado, } "Aberrations introduced in off-axis testing of spherical surfaces," Optical Engineering 35(11), (1 November 1996). https://doi.org/10.1117/1.601064 . Submission:
JOURNAL ARTICLE
5 PAGES


SHARE
RELATED CONTENT

Interference test procedures for telescopic mirrors
Proceedings of SPIE (February 25 2004)
Practical Tilted Mirror Systems
Proceedings of SPIE (December 18 1986)
Absolute measurement of spherical surfaces
Proceedings of SPIE (December 31 1990)
Aspheric surface testing techniques
Proceedings of SPIE (December 31 1990)

Back to Top