1 November 1996 Edge quality metric for arbitrary two-dimensional edges
Author Affiliations +
Optical Engineering, 35(11), (1996). doi:10.1117/1.601060
Abstract
A quality metric for an arbitrary 2D edge contour is presented. This metric is constructed from measured physical characteristics of the edge. It enables a comparison of performance of different edge detecting algorithms and provides a tool for the optimization of edge detectors. The metric was verified using the Canny’s edge detector applied to a set of artificial images varying in image quality.
Paul V. Khvorostov, Michael Braun, Colin S. Poon, "Edge quality metric for arbitrary two-dimensional edges," Optical Engineering 35(11), (1 November 1996). http://dx.doi.org/10.1117/1.601060
JOURNAL ARTICLE
5 PAGES


SHARE
KEYWORDS
Sensors

Signal to noise ratio

Edge detection

Distance measurement

Convolution

Detection and tracking algorithms

Optical engineering

Back to Top