1 November 1996 Origin of modulated interference effects in photoelastic modulators
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Optical Engineering, 35(11), (1996). doi:10.1117/1.601073
Abstract
Photoelastic modulators (PEMs) consisting of a plane-parallel dielectric plate exhibit multiple internal reflections like those in a Fabry- Perot interferometer. If a PEM is illuminated by a coherent radiation source at normal incidence, a modulation of the intensity of transmitted light can be observed. In a recent paper by Oakberg, the modulated interference effect was interpreted as periodic thickness variations of the PEM plate. We discuss three different models that describe interference modulation in PEMs. Then, it is experimentally demonstrated for a PEM with a symmetric optical element that the periodic variation of the refractive index in the PEM plate is responsible for this modulated interference effect.
Ernst Polnau, Hans Lochbihler, "Origin of modulated interference effects in photoelastic modulators," Optical Engineering 35(11), (1 November 1996). http://dx.doi.org/10.1117/1.601073
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KEYWORDS
Modulation

Refractive index

Modulators

Photoelastic modulators

Optical components

Optical amplifiers

Oscilloscopes

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