1 December 1996 Testing parameters in a common test method for phi90 mm/600 Mbyte phase-change optical disks
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Abstract
Six samples of phase-change optical disks made by several different manufacturers are evaluated using the developed tester. It is observed that the dependence of recording and erase characteristics on the linear velocity of laser beam scanning on the track and frequency of recording signal were very much affected by laser power. The phase jitter is measured by a proposed test method and the effects of disk tilt and mark distortion on the measured values are indicated by a computer simulation. Common testing methods are discussed and some results of common tests are presented.
Seiya Yamada, Takahiro Kubo, Kohei Yamauchi, Junji Ohtsubo, Masahisa Shinoda, T. Utakouji, Toshiaki Iwai, "Testing parameters in a common test method for phi90 mm/600 Mbyte phase-change optical disks," Optical Engineering 35(12), (1 December 1996). https://doi.org/10.1117/1.601115
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