1 April 1996 Spatial light modulator phase depth determination from optical diffraction information
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Optical Engineering, 35(4), (1996). doi:10.1117/1.600704
Abstract
A noninterferometric technique is presented for determining the phase modulating characteristics of spatial light modulators. Examining the far-field diffraction pattern intensity distribution for specific input functions enables the phase modulation to be calculated. Results are compared with usual interferometric techniques for a liquid crystal based modulator.
John L. McClain, Peter S. Erbach, Don A. Gregory, Francis T. S. Yu, "Spatial light modulator phase depth determination from optical diffraction information," Optical Engineering 35(4), (1 April 1996). https://doi.org/10.1117/1.600704
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