1 April 1996 Spatial light modulator phase depth determination from optical diffraction information
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Abstract
A noninterferometric technique is presented for determining the phase modulating characteristics of spatial light modulators. Examining the far-field diffraction pattern intensity distribution for specific input functions enables the phase modulation to be calculated. Results are compared with usual interferometric techniques for a liquid crystal based modulator.
John L. McClain, John L. McClain, Peter S. Erbach, Peter S. Erbach, Don A. Gregory, Don A. Gregory, Francis T. S. Yu, Francis T. S. Yu, } "Spatial light modulator phase depth determination from optical diffraction information," Optical Engineering 35(4), (1 April 1996). https://doi.org/10.1117/1.600704 . Submission:
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