1 April 1996 Subsurface defect detection in ceramic materials using optical gating techniques
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Optical Engineering, 35(4), (1996). doi:10.1117/1.601031
Abstract
We demonstrate the use of optical gating techniques for determining the size and location of defects in advanced ceramic materials. The subsurface region in a bearing-grade silicon nitride ceramic material is probed using an optical gate based on broadband Raman scattering. Experimental results indicate that the size and distribution of small subsurface defects can be determined.
Philip R. Battle, Mark Bashkansky, Rita Mahon, John F. Reintjes, "Subsurface defect detection in ceramic materials using optical gating techniques," Optical Engineering 35(4), (1 April 1996). http://dx.doi.org/10.1117/1.601031
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KEYWORDS
Ceramics

Raman spectroscopy

Polarizers

Defect detection

Light scattering

Optical amplifiers

Polarization

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