1 May 1996 On the uniform composition of InxGa1-xSb (x=0.20) bulk crystals for special optoelectronic devices
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Optical Engineering, 35(5), (1996). doi:10.1117/1.600633
Abstract
Polycrystalline p-type InxGa1-xSb (x=50.20) for optoelectronic devices has been obtained by rapid direct synthesis from highpurity (99.9999%) In, Ga, and Sb. The uniformity of the composition has been checked by neutron activation analysis and also by x-ray diffractometry (Vegard-law approximation). From Hall-effect measurements an acceptor concentration of 3.2x1017 cm-23 and a mobility of 628 cm2/V s for holes, at liquid nitrogen temperature, have been determined, and from absorption measurements, a quite diffuse edge for the optical absorption coefficient resulted. This paper describes the method of rapid direct synthesis of the ternary compound and the techniques used for the characterization of this material for special optoelectronic applications.
Stefan A. Manea, Ion I. Munteanu, Cristiana E. A. Grigorescu, Michaela F. Logofatu, Mihail F. Lazarescu, "On the uniform composition of InxGa1-xSb (x=0.20) bulk crystals for special optoelectronic devices," Optical Engineering 35(5), (1 May 1996). http://dx.doi.org/10.1117/1.600633
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KEYWORDS
Antimony

Gallium

Crystals

Indium

Absorption

Temperature metrology

Optoelectronic devices

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