1 June 1996 Sensitivity-variable moire topography with a phase shift method
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Optical Engineering, 35(6), (1996). doi:10.1117/1.600759
Abstract
We propose a projection moire´ topography with a phase shift method for measuring the fine profile of an object. In this method, a set of interference fringes made using a Mach-Zehnder interferometer and a dove prism is projected on an object surface to generate moire´ fringes. The interval between the moire´ fringes can be easily changed in a range of 160 to 300 µm and we can realize sensitivity-variable moire´ contouring. Also, the phases of the moire´ -fringe pattern are easily changed by shifting one of the interference fringe patterns and the depth at each point on the object are computed with a high accuracy from the several moire´ -fringe patterns with different phases. Although the interferometer is used in the system, the setup is robust against vibrations.
Tetsuya Matsumoto, Yoichi Kitagawa, Takumi Minemoto, "Sensitivity-variable moire topography with a phase shift method," Optical Engineering 35(6), (1 June 1996). http://dx.doi.org/10.1117/1.600759
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KEYWORDS
Phase shifts

Interferometers

3D image processing

Beam splitters

Image processing

Mirrors

Optical engineering

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