1 July 1996 Projection moire deflectometry for the automatic measurement of phase objects
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Optical Engineering, 35(7), (1996). doi:10.1117/1.600777
Abstract
A computer-based method for measuring the local refractive index gradient of phase objects using the projection moire´ technique is presented. A phase object is placed in front of the projected grating pattern. The image of the projected grating pattern deforms in accordance with the variation of the refractive index of the phase object. The moire´ fringe is generated by superimposing two images of the projected gratings pattern (the original pattern and the deformed pattern). The optical transmission characteristics of projection moire´ fringe is discussed. The moire´ deflectogram is analyzed by Fourier filtering and the phasemeasuring technique.
Ming Wang, "Projection moire deflectometry for the automatic measurement of phase objects," Optical Engineering 35(7), (1 July 1996). http://dx.doi.org/10.1117/1.600777
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KEYWORDS
Deflectometry

Refractive index

Phase measurement

Image processing

CCD cameras

Phase shifts

Ronchi rulings

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