1 October 1997 High-resolution short-wave infrared spectrograph optics
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Optical Engineering, 36(10), (1997). doi:10.1117/1.601513
Abstract
An optical system for a high-resolution short-wave IR (SWIR) spectrograph to be employed in remote sensing applications is described. The instrument covers the spectral range from 1200 to 2400 nm and images a 9.4-deg line object onto a 2-D PtSi sensor. Spatial and spectral resolution requirements were set at 0.33 mrad and 10 nm, respectively. While signal strength calculations indicated that an aperture equivalent to f /1.8 would be adequate, because of the anticipated lower signal levels at the long-wavelength end, special attention was paid in the antireflection coating design stage to partially compensate for the large discrepancy in signal strengths found across the spectral range.
Ian P. Powell, "High-resolution short-wave infrared spectrograph optics," Optical Engineering 36(10), (1 October 1997). http://dx.doi.org/10.1117/1.601513
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KEYWORDS
Spectrographs

Short wave infrared radiation

Cameras

Antireflective coatings

Infrared spectroscopy

Objectives

Diffraction gratings

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