1 December 1997 High-resolution distance meter using optical modulators at 3.5 GHz
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Optical Engineering, 36(12), (1997). doi:10.1117/1.601573
Abstract
A high-resolution distance meter is fabricated using optical waveguide modulators. The modulation frequencies of the optical modulators are around 3.5 GHz, while the modulation frequencies of the optical intensity are around 7 GHz because the modulation bias voltages are set at the peaks of the electrooptic characteristics. The distance meter was evaluated in the National Research Laboratory of Metrology (NRLM) tunnel, which is a semiunderground tunnel. The measurement resolution has a standard deviation of 12 ?m for a distance range of 0.5 to 5 m after correction of the cyclic error.
Ichiro Fujima, Katuo Seta, Hirokazu Matsumoto, Hisashi Yoshida, "High-resolution distance meter using optical modulators at 3.5 GHz," Optical Engineering 36(12), (1 December 1997). http://dx.doi.org/10.1117/1.601573
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KEYWORDS
Modulation

Phase measurement

Waveguides

Optical modulators

Phase shift keying

Interferometers

Modulators

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