1 February 1997 Measurement of thermal parameters of solids by a modified photodeflection method
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Optical Engineering, 36(2), (1997). doi:10.1117/1.601208
Abstract
A modified photodeflection method based on the wave optics approach is proposed for the thermal parameter measurement of volume materials and thin films. Experimental and theoretical results of the application of this method to measurements of the thermal parameters of solids are presented. It is shown that the modified photodeflection method can be used in a wide frequency range of thermal waves and provides a lower mean squared error between experimental and theoretical results in comparison with the ordinary method.
Alexej L. Glazov, Kyrill L. Muratikov, "Measurement of thermal parameters of solids by a modified photodeflection method," Optical Engineering 36(2), (1 February 1997). http://dx.doi.org/10.1117/1.601208
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KEYWORDS
Laser beam diagnostics

Geometrical optics

Solids

Modulation

Silicon films

Thin films

Silicon

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