Quantitative characterization of material inhomogeneities by thermal waves

Uwe R. Seidel; Ton Thi Ngoc Lan; Heinz-Guenter Walther; Bernhard Schmitz; Jurgen Geerkens; Gert Goch

doi:10.1117/1.601235

1 February 1997 Quantitative characterization of material inhomogeneities by thermal waves

Uwe R. Seidel; Ton Thi Ngoc Lan; Heinz-Guenter Walther; Bernhard Schmitz; Jurgen Geerkens; Gert Goch

Author Affiliations +

Optical Engineering, 36(2), (1997). https://doi.org/10.1117/1.601235

Abstract

Photothermal measurement techniques offer the possibility to determine thermal properties on and below the sample’s surface. Thus, subsurface thermal inhomogeneities such as defects, buried structures, and continuous profiles of thermal parameters become accessible by photothermal means. Our special interest is focused on the quantitative characterization of material modifications in near-surface layers that are induced by thermal (such as hardening) or mechanical (such as grinding) treatments of the surface as well as the reconstruction of a subsurface structure’s depth, size, and defect strength. Altogether, these investigations are aimed to develop photothermal techniques toward a true quantitative and noncontact inspection method for the nondestructive evaluation of opaque solids.

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Uwe R. Seidel, Uwe R. Seidel, Ton Thi Ngoc Lan, Ton Thi Ngoc Lan, Heinz-Guenter Walther, Heinz-Guenter Walther, Bernhard Schmitz, Bernhard Schmitz, Jurgen Geerkens, Jurgen Geerkens, Gert Goch, Gert Goch, } "Quantitative characterization of material inhomogeneities by thermal waves," Optical Engineering 36(2), (1 February 1997). https://doi.org/10.1117/1.601235 . Submission:

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