1 February 1997 Quantitative characterization of material inhomogeneities by thermal waves
Author Affiliations +
Optical Engineering, 36(2), (1997). doi:10.1117/1.601235
Abstract
Photothermal measurement techniques offer the possibility to determine thermal properties on and below the sample’s surface. Thus, subsurface thermal inhomogeneities such as defects, buried structures, and continuous profiles of thermal parameters become accessible by photothermal means. Our special interest is focused on the quantitative characterization of material modifications in near-surface layers that are induced by thermal (such as hardening) or mechanical (such as grinding) treatments of the surface as well as the reconstruction of a subsurface structure’s depth, size, and defect strength. Altogether, these investigations are aimed to develop photothermal techniques toward a true quantitative and noncontact inspection method for the nondestructive evaluation of opaque solids.
Uwe R. Seidel, Ton Thi Ngoc Lan, Heinz-Guenter Walther, Bernhard Schmitz, Jurgen Geerkens, Gert Goch, "Quantitative characterization of material inhomogeneities by thermal waves," Optical Engineering 36(2), (1 February 1997). http://dx.doi.org/10.1117/1.601235
JOURNAL ARTICLE
15 PAGES


SHARE
KEYWORDS
Signal to noise ratio

Modulation

Ceramics

Diffusion

Deconvolution

Optical engineering

Point spread functions

RELATED CONTENT

Research based on the CAN bus based simulation platform of...
Proceedings of SPIE (September 02 2003)
Internal laser metrology for POINTS
Proceedings of SPIE (September 10 1993)
Photonic crystal couplers for slow light
Proceedings of SPIE (January 29 2008)

Back to Top