1 June 1997 Wavefront analysis with high-accuracy inversion interferometer
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Optical Engineering, 36(6), (1997). doi:10.1117/1.601369
Abstract
A recently introduced wavefront analyzer, based on a Fresnel-lens array, is improved by incorporating phase-shifting procedures. The resulting compact and stable interferometer can measure wavefront distortions with extremely high accuracy. In our experiments, with no special efforts at environmental isolation, the instrumental noise level was under 0.02?.
Boris Spektor, Joseph Shamir, Alexander M. Bekker, "Wavefront analysis with high-accuracy inversion interferometer," Optical Engineering 36(6), (1 June 1997). http://dx.doi.org/10.1117/1.601369
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KEYWORDS
Wavefronts

Interferometers

Mirrors

Fresnel lenses

Phase shifts

Wavefront analysis

Reflectivity

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