1 July 1997 Digital in-plane electronic speckle pattern shearing interferometry
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Optical Engineering, 36(7), (1997). doi:10.1117/1.601386
Abstract
A novel implementation of the method for obtaining the partial derivatives of in-plane and out-of-plane displacement fields in the inplane electronic speckle pattern shearing interferometry (ESPSI) configuration is described. Lateral shear interferograms of object image fields generated by individual symmetrical illuminating beams are recorded independently. The phases are calculated using the temporal phase-stepping method and their digital subtraction/addition gives required in-plane/out-of-plane displacement derivatives, respectively. Phase stepping is readily performed in the setup using fiber optics and modulated laser diode illumination without any mechanical movement of the components.
Krzysztof Patorski, Artur G. Olszak, "Digital in-plane electronic speckle pattern shearing interferometry," Optical Engineering 36(7), (1 July 1997). http://dx.doi.org/10.1117/1.601386
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KEYWORDS
Speckle pattern

Interferometry

Semiconductor lasers

Prisms

Wavefronts

Fringe analysis

Interferometers

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