1 September 1997 Holographic interferometric microscope for complete displacement determination
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Optical Engineering, 36(9), (1997). doi:10.1117/1.601420
Abstract
Holographic microscopy for the simultaneous interferometric determination of all displacement components is described. The recording and the evaluation procedures are optimized by three illumination directions and conjugate reconstruction, respectively. Microscopic observation is completely separated from holographic recording. The holographic microscope performs maximum flexibility of magnification combined with high imaging accuracy. The phase-shift technique and Fourier analysis with a carrier frequency are applied for interferogram evaluation. Both methods are compared regarding the measurement range, accuracy, and handling. In-plane and out-of-plane displacement components can be measured simultaneously by both evaluation methods. A cantilever beam, a circular plate, and a surface-mounted microresistor are used to demonstrate the capabilities of the holographic microscope.
Oliver Kruschke, Guenther K.G. Wernicke, Torsten Huth, Nazif Demoli, Hartmut Gruber, "Holographic interferometric microscope for complete displacement determination," Optical Engineering 36(9), (1 September 1997). http://dx.doi.org/10.1117/1.601420
JOURNAL ARTICLE
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KEYWORDS
Microscopes

Holography

Holographic interferometry

Holograms

Objectives

Optical filters

Heterodyning

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