Experimental approach for measuring resolution of complementary metal oxide semiconductor imaging systems

Hong Wei; Eion Johnston; T. David Binnie

doi:10.1117/1.601778

1 September 1998 Experimental approach for measuring resolution of complementary metal oxide semiconductor imaging systems

Hong Wei, Eion Johnston, T. David Binnie

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Optical Engineering, Vol. 37, Issue 9, (September 1998). https://doi.org/10.1117/1.601778

This paper demonstrates a convenient experimental technique for measuring the resolution of a digital imaging system. The spatial frequency response of the system is obtained by deriving the modulation transfer function (MTF) from the measured contrast transfer function (CTF). Basic signal-processing techniques are used to establish a relationship between the MTF and the CTF. Experimental methodology is discussed with respect to avoidance of shift variation in the CTF. Discrete Fourier transformation is applied for a power-spectrum analysis of the MTF. Using the CTF as a measure of performance, a series of experiments were carried out to characterize an imaging system based on an integrated CMOS camera. The experimental results showed that this approach can be applied in general, for the assessment of spatial resolution for digital imaging systems.

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Hong Wei, Eion Johnston, and T. David Binnie "Experimental approach for measuring resolution of complementary metal oxide semiconductor imaging systems," Optical Engineering 37(9), (1 September 1998). https://doi.org/10.1117/1.601778

Published: 1 September 1998

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