1 January 1998 Concepts of direct in-plane strain and variable sensitivity in-plane displacement measurements using high-resolution moire photography
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Abstract
High-resolution moire´ photography1,2 has been of interest for many years for the investigation of in-plane displacements over a large range of specimen dimensions. The method’s main advantages stem from its requirement to illuminate the object with white light, its user-friendliness in non-laboratory environments, and its ability to provide whole field visualization of the undergone deformations. Optical measurements are, however, available only in the form of displacement and not strain maps, a quantity often of more interest to the engineer.
Pramod Kumar Rastogi, "Concepts of direct in-plane strain and variable sensitivity in-plane displacement measurements using high-resolution moire photography," Optical Engineering 37(1), (1 January 1998). https://doi.org/10.1117/1.601620
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