1 October 1998 Interferometric measurements of small-scale irregularities: highly reflecting surfaces
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Abstract
With uncoated optical surfaces, it is possible to use a Fizeau interferometer to make direct measurements of small-scale irregularities with very small amplitudes. However, problems arise with highly reflecting surfaces. Some optical systems that can be used for such measurements are described.
Parameswaran Hariharan, "Interferometric measurements of small-scale irregularities: highly reflecting surfaces," Optical Engineering 37(10), (1 October 1998). https://doi.org/10.1117/1.601814 . Submission:
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