1 March 1998 Phase-shifting grating projection moire topography
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Optical Engineering, 37(3), (1998). doi:10.1117/1.601934
Abstract
A phase-shifting projection moire´ method particularly intended for high-speed three-dimensional inspection of fine objects is presented. Emphasis is on realization of phase-shifting fringe analysis in projection moire´ topography using a set of line grating pairs designed to provide different phase shifts in sequence. Further, a time-integral fringe capturing scheme is devised to remove undesirable high-frequency original grating patterns in real time without time-consuming software image processing. Finally, the performances of the proposed method are discussed with measurement results.
Yi-Bae Choi, Seung-Woo Kim, "Phase-shifting grating projection moire topography," Optical Engineering 37(3), (1 March 1998). http://dx.doi.org/10.1117/1.601934
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KEYWORDS
Phase shifts

Fringe analysis

Image processing

Optical design

Reflectivity

Charge-coupled devices

Phase measurement

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