1 August 1998 Electronic speckle pattern interferometry with thin beam illumination of miniature reflection and transmission "speckling" elements for in-plane deformation measurements
Author Affiliations +
Abstract
A new method of electronic speckle pattern interferometry (ESPI) for in-plane deformation measurements is presented. Unlike usual ESPI methods used for in-plane deformation measurements with two symmetrical smooth illuminating waves, we introduce miniature speckling elements and thin laser beam illumination of them. The miniature elements serve for generating two symmetrical speckled waves. These miniature speckling elements are produced as reflection or transmission holograms. Nonholographic speckling elements were also tested. We present a family of flexible electronic speckle pattern interferometers for in-plane deformation analysis based on our method. Due to their simplicity, compactness, and low cost, the devices are ideally suited for industrial automated inspection. Experimental results obtained with the novel ESPI devices are given.
Valery Petrov, Bernhard Lau, "Electronic speckle pattern interferometry with thin beam illumination of miniature reflection and transmission "speckling" elements for in-plane deformation measurements," Optical Engineering 37(8), (1 August 1998). https://doi.org/10.1117/1.602008
JOURNAL ARTICLE
6 PAGES


SHARE
Back to Top