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1 August 1998 Electronic speckle pattern interferometry with thin beam illumination of miniature reflection and transmission "speckling" elements for in-plane deformation measurements
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Valery Petrov and Bernhard Lau "Electronic speckle pattern interferometry with thin beam illumination of miniature reflection and transmission "speckling" elements for in-plane deformation measurements," Optical Engineering 37(8), (1 August 1998). https://doi.org/10.1117/1.602008
Published: 1 August 1998
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