1 December 1999 Invariant pattern recognition: smart algorithms for segmented two-dimensional patterns with an axis of symmetry
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Optical Engineering, 38(12), (1999). doi:10.1117/1.602306
Abstract
We propose an approach to realize distortion-invariant pattern recognition for segmented 2-D patterns with an axis of symmetry. Parameters of distorted input pattern are first estimated and normalized. Invariant pattern recognition is then achieved by correlating the normalized input pattern with the undistorted reference, using a classical matched filter or its modified version. This approach realizes pattern recognition invariant to rotation, scale, and projection without the need to synthesize a distortion-invariant filter. Simulation results demonstrate the effectiveness of this approach.
Jianping Yao, Guy J. Lebreton, "Invariant pattern recognition: smart algorithms for segmented two-dimensional patterns with an axis of symmetry," Optical Engineering 38(12), (1 December 1999). https://doi.org/10.1117/1.602306
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