Wavelet transform for detection of partial fringe patterns induced by defects in nondestructive testing of holographic interferometry and electronic speckle pattern interferometry

Xide Li

doi:10.1117/1.1308485

1 October 2000 Wavelet transform for detection of partial fringe patterns induced by defects in nondestructive testing of holographic interferometry and electronic speckle pattern interferometry

Xide Li

Author Affiliations +

Optical Engineering, Vol. 39, Issue 10, (October 2000). https://doi.org/10.1117/1.1308485

Holographic interferometry (HI) and electronic speckle pattern interferometry (ESPI) are widely used in nondestructive testing (NDT). In the HI and ESPI measurement techniques, the deformations are made visible as fringe patterns while an inspected sample is loaded. Defects will lead to typical local deformations deviating from the global deformation. To achieve automatic detection of the defect characteristics, the wavelet transform (WT) method is used. Wavelets can be used to generate a multiresolution analysis of a signal and they are very sensitive to the changes in a transient signal or an abrupt signal if suitable wavelets are chosen. These changes correspond to the partial fringe patterns caused by the local defects in HI and ESPI nondestructive testing. We demonstrate how the Morlet wavelet is used to detect the defect-induced partial fringe patterns from the global fringe pattern in HI and the ESPI nondestructive testing.

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Xide Li "Wavelet transform for detection of partial fringe patterns induced by defects in nondestructive testing of holographic interferometry and electronic speckle pattern interferometry," Optical Engineering 39(10), (1 October 2000). https://doi.org/10.1117/1.1308485

Published: 1 October 2000

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